| Constant-step stress accelerated life test of VFD under Weibull distribution case |
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| 作者姓名： | 张建平 耿新民 |
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| 作者单位： | [1]Department of Information ＆ Electronic Engineering, Zhejiang University, Hangzhou 310027, China [2]Faculty of Computer and Information Engineering, Shanghai University of Electric Power Shanghai 200090, China |
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| 基金项目： | the Postdoctoral Scientific Research Foundationof Zhejiang Province of China，浙江大学校科研和教改项目 |
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| 摘 要： | Constant-step stress accelerated life test of Vacuum Fluorescent Display (VFD) was conducted with increased cathode temperature. Statistical analysis was done by applying Weibull distribution for describing the life, and Least Square Method (LSM) for estimating Weibull parameters. Self-designed special software was used to predict the VFD life. Numerical results showed that the average life of VFD is over 30000 h, that the VFD life follows Weibull distribution, and that the life-stress relationship satisfies linear Arrhenius equation completely. Accurate calculation of the key parameter enabled rapid estimation of VFD life.
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| 关 键 词： | 真空荧光显示器 寿命测试 VFD Weibull分布 Arrhenius方程 |
| 收稿时间： | 2005-01-18 |
| 修稿时间： | 2005-05-18 |
Constant-step stress accelerated life test of VFD under Weibull distribution case |
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| Zhang Jian-ping,Geng Xin-min.Constant-step stress accelerated life test of VFD under Weibull distribution case[J].Journal of Zhejiang University Science,2005,6(7):722-727. |
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| Authors: | Zhang Jian-ping Geng Xin-min |
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| Institution: | (1) Department of Information & Electronic, Engineering, Zhejiang University, 310027 Hangzhou, China;(2) Faculty of Computer and Information Engineering, Shanghai University of Electric Power, 200090 Shanghai, China |
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| Abstract: | Constant-step stress accelerated life test of Vacuum Fluorescent Display (VFD) was conducted with increased cathode temperature. Statistical analysis was done by applying Weibull distribution for describing the life, and Least Square Method (LSM)for estimating Weibull parameters. Self-designed special software was used to predict the VFD life. Numerical results showed that the average life of VFD is over 30000 h, that the VFD life follows Weibull distribution, and that the life-stress relationship satisfies linear Arrhenius equation completely. Accurate calculation of the key parameter enabled rapid estimation of VFD life. |
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| Keywords: | Vacuum Fluorescent Display Accelerated life test Constant-step Weibull Average life |
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