| 二极管伏安特性曲线测试技术探讨 |
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| 引用本文： | 肖景魁,张丽.二极管伏安特性曲线测试技术探讨[J].沈阳教育学院学报,2007,9(2):107-109. |
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| 作者姓名： | 肖景魁 张丽 |
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| 作者单位： | 1. 沈阳大学,理学院,辽宁,沈阳,110016
2. 沈阳理工大学,机械学院,辽宁,沈阳,110168 |
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| 摘 要： | 分析了三种伏安法测二极管特性曲线电路的基本原理及对实验仪器的要求,并指出了实验中应注意的问题及改进方法。
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| 关 键 词： | 二极管 伏安特性 阈值电压 测试电路 |
| 文章编号： | 1008-3863（2007）02-0107-03 |
| 修稿时间： | 2006-09-01 |
Measure Technique on Voltage-current Characteristic of Diode |
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| XIAO Jing-kui,ZHANG Li.Measure Technique on Voltage-current Characteristic of Diode[J].Journal of Shenyang College of Education,2007,9(2):107-109. |
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| Authors: | XIAO Jing-kui ZHANG Li |
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| Institution: | 1. School of Science, Shenyang University, Shenyang 110016, China; 2. School of Mechanical Engineering, Shenyang Ligong University, Shenyang 110168, China |
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| Abstract: | The principles and the request to the test instruments of three circuits for measuring the voltage-current characteristic of diode are analyzed.The problem of the experiment and the improving means for the circuits are pointed out. |
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| Keywords: | diode voltage-current characteristic threshold voltage test circuit |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
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