| 集成运算放大器参数测试仪设计 |
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| 引用本文： | 何丹.集成运算放大器参数测试仪设计[J].襄樊职业技术学院学报,2010,9(6):28-30. |
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| 作者姓名： | 何丹 |
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| 作者单位： | 无锡商业职业技术学院,电子工程系,江苏,无锡,214153 |
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| 摘 要： | 本集成运算放大器参数测试仪,以单片机AT89S52为核心,由可编程键盘、显示接口芯片8279构成的键盘、显示电路、MAX191的A/D转换等模块组成。设计中采用了模块化的设计方法,实现了对集成运算放大器输入失调电压、输入失调电流、交流差模开环电压增益和交流共模抑制比参数的测量。
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| 关 键 词： | AT89S52 MAX191 8279 KCMR |
Integrated Operational Amplifier Parameter Test Instrument |
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| HE Dan.Integrated Operational Amplifier Parameter Test Instrument[J].Journal of Xiangfan Vocational and Technical College,2010,9(6):28-30. |
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| Authors: | HE Dan |
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| Institution: | HE Dan (Wuxi Institute of Commece, Wuxi Jiangsu 214153, China) |
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| Abstract: | The integrated operational amplifier parameter tester, a microcontroller AT89S52 as the core, the programmable keyboard, display interface chip 8279 consisting of keyboard, display circuit, MAX191＇s A / D conversion module. The design of modular design method, the realization of integrated operational amplifier input offset voltage, input offset current, ACvoltage differential- mode open- loop gain and CMRR exchange parameters were measured. |
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| Keywords: | AT89S52 MAX191 8279 KCMR |
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