—种利用白光光谱仪测量绝对距离的方法研究 |
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引用本文: | 沈晓波,王留留.—种利用白光光谱仪测量绝对距离的方法研究[J].中国科技纵横,2011(14):337-337,82. |
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作者姓名: | 沈晓波 王留留 |
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作者单位: | 淮南师范学院电气信息工程系,安徽淮南230038 |
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基金项目: | 本论文得到安徽省优秀青年项目(2011SQRL139)及淮南师范学院校级青年科研项目(2010QNL08)的资助. |
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摘 要: | 本文研究利用一种白光光谱仪测量绝对距离和位移的方法。利用迈克耳逊干涉结构,使用光谱仪S2000,进行光谱分析,在知道光学元件的群折射率和厚度的情况下,利用均衡波长的概念就可以得出绝对距离。该方法不需要应用相位重现程序,其测量范围大大超过传统白光干涉技术的测量范围,为绝对距离的测量提供一些详尽的参考。
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关 键 词: | 白光 光谱干涉仪 光谱仪 绝对距离 色散 |
Research on Measurement of Absolute Distances and Displacements by an Interferometric Technique Using a White-light Spectral Interferometer |
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Authors: | SHEN Xiaobo WANG Liu-liu |
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Institution: | Huainan Normal University Huainan 230038 China |
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Abstract: | This article introduces a measurement of absolute distances and displacements by an interferometric technique using a white-light fiber optic spectrometer. Employing a dispersive Michelson interferometer and a low-resolntion spectrometer and with different amounts of dispersion in the interferometer, and knowing dispersion in the interferometer and the bandpass of the spectrometer, the absolute distance can be measured. The new technique extends the use of white-light spectral interferometer for distance and displacement measurement with high resolution, and at the same time it do not need the phase- recurring technique. It offers some reference for the measurement of absolute distance. |
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Keywords: | White-light Spectral interferometer Spectrometer Absolute Distance Dispersion |
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