| 两线星型扫描测试控制器设计 |
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| 引用本文： | 建珍珍,颜学龙.两线星型扫描测试控制器设计[J].大众科技,2012,14(3):63-66. |
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| 作者姓名： | 建珍珍 颜学龙 |
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| 作者单位： | 桂林电子科技大学电子工程与自动化学院,广西桂林,541004 |
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| 基金项目： | 广西研究生科研创新项目 |
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| 摘 要： | 针对现代测试系统需要较少的引脚实现测试要求的现状,IEEE 1149.7标准提供了2线星型(Star-2)扫描拓扑。由于目前Star-2扫描拓扑尚处于理论研究阶段,产生相关的测试信号对今后构建测试系统具有重要的意义。以该标准为依据,利用Quartus II开发平台设计了基于FPGA的两线星型扫描测试控制器,并通过Module-Sim6.4a进行了仿真验证。结果表明该控制器实现了标准协议和高级协议的相互转换,能够产生符合IEEE 1149.7标准的Star-2扫描测试信号以及MScan扫描格式。
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| 关 键 词： | IEEE1149.7标准 星型扫描拓扑 高级协议 MScan |
Testing Controller Design Based On Star-2 Scanning |
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| Abstract: | On account of the situation that modern testing system requires fewer pins to achieve test requirements,the IEEE 1149.7 standard provides a type of scanning topology Star-2.At present Star-2 scanning topology still belongs to the stage of theoretical research,so it is of great significance that producing relevant test signal to construct test system.It designes the Star-2 scanning test controller based on FPGA using the Quartus II platform.The controller is simulated in Module-Sim6.4a environment.Emulation proves that the controller realizes the conversion of the standard protocols and senior protocols,can produce Star-2 scanning test signal and MScan which according to the standard of IEEE1149.7. |
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| Keywords: | IEEE 1149 7 Star-2 senior agreement MScan |
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